As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://marcoztkbq.dm-blog.com/39607768/understanding-the-physical-design-perspective-in-modern-vlsi-education
Low-Power Design As a Core Competency in Modern VLSI Engineering
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